Acronym |
Brief Description |
* |
User Assigned |
(b) |
Buried macrocell |
CTC |
Control Term Clock |
CTR |
Control Term Reset |
CTS |
Control Term Set |
CTE |
Control Term Output Enable |
DFF |
D Flip-Flop |
DDFF |
Dual-edge triggered D Flip-Flop |
DEFF |
D Flip-Flop with Enable |
DDEFF |
Dual-edge triggered D Flip-Flop with Enable |
DG |
DataGATE |
DGE |
DataGATE Enable |
FB# |
Function Block number |
GCK# |
Global Clock number |
GTS# |
Global Output Enable number |
GSR |
Global Set/Reset |
I |
Input |
I/O |
Input/Output |
IR |
Direct Input Register |
KPR |
Keeper |
Latch |
Transparent latch |
MC# |
Macrocell number |
O |
Output |
OD |
Open Drain |
PU |
Pullup |
PD |
Pulldown |
/S |
After any flop/latch type indicates initial state is Set |
TCK |
Test clock |
TDI |
Test data input |
TDO |
Test data output |
TFF |
Toggle Flip-Flop |
TDFF |
Dual edge triggered Toggle Flip-Flop |
TMS |
Test mode select |
VREF |
Voltage Reference |